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Journal of Materials Science: Materials in Electronics

Volumn 24, Issue 4, 2013, Pages 1105-1111

Effects of annealing on thermoelectric properties of Sb2Te 3 thin films prepared by radio frequency magnetron sputtering

(4) Fang, Bo a Zeng, Zhigang a Yan, Xiaoxia a Hu, Zhiyu a

a SHANGHAI UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; ELECTRICAL CONDUCTIVITY; ELECTRICAL TRANSPORT PROPERTIES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HALL COEFFICIENT MEASUREMENTS; RADIO FREQUENCY MAGNETRON SPUTTERING; RADIO FREQUENCY MAGNETRON SPUTTERING METHOD; THERMOELECTRIC PROPERTIES;

ANNEALING; ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; HALL MOBILITY; SCANNING ELECTRON MICROSCOPY; SEEBECK COEFFICIENT; THERMOELECTRIC EQUIPMENT; THIN FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

FILM PREPARATION;

EID: 84875718052 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-012-0888-1 Document Type: Article

Times cited : (70)

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