Electrochemical charging of CdSe quantum dot films: Dependence on void size and counterion proximity

ACS Nano

Volumn 7, Issue 3, 2013, Pages 2500-2508

  Boehme, Simon C ^a   Wang, Hai ^a,c   Siebbeles, Laurens D A ^a   Vanmaekelbergh, Daniel ^b   Houtepen, Arjan J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UTRECHT UNIVERSITY   (Netherlands)

^c MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

electrochemical charging; energy level; layer by layer; ligand; quantum dot; spectroelectrochemistry; surface functionalization

Indexed keywords

ELECTROCHEMICAL CHARGE; ELECTROCHEMICAL CHARGING; ELECTROCHEMICAL MEASUREMENTS; ELECTROCHEMICAL POTENTIAL; LAYER BY LAYER; MEASUREMENT TECHNIQUES; SUPPORTING ELECTROLYTE; SURFACE FUNCTIONALIZATION;

ELECTROLYTES; ELECTRON ENERGY LEVELS; LIGANDS; OPTOELECTRONIC DEVICES; POSITIVE IONS; SEMICONDUCTOR QUANTUM DOTS; SOLAR CELLS; SPECTROELECTROCHEMISTRY;

THIN FILMS;

EID: 84875650386     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3058455     Document Type: Article

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