On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization

Information and Software Technology

Volumn 55, Issue 5, 2013, Pages 897-917

  Jiang, Bo ^a   Zhai, Ke ^b   Chan, W K ^c   Tse, T H ^b   Zhang, Zhenyu ^d  

^a BEIHANG UNIVERSITY   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^d INSTITUTE OF SOFTWARE   (China)

Author keywords

Adequacy criterion; Fault localization; MC DC; Test case prioritization; Testing debugging integration

Indexed keywords

ADEQUACY CRITERION; CONTROLLED EXPERIMENT; FAULT LOCALIZATION; MC/DC; POSTMORTEM ANALYSIS; SOFTWARE DEVELOPMENT EFFORT; TEST CASE PRIORITIZATION; TESTING AND DEBUGGING;

EXPERIMENTS; INTEGRATION; STATISTICS;

INTEGRATION TESTING;

EID: 84875215650     PISSN: 09505849     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infsof.2012.10.001     Document Type: Conference Paper

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