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Volumn , Issue , 2019, Pages 209-224

Klee: Unassisted and automatic generation of high-coverage tests for complex systems programs

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; OPEN SYSTEMS; SYSTEMS ANALYSIS;

EID: 85076893888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2387)

References (39)
  • 1
    • 85076917729 scopus 로고    scopus 로고
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    • Busybox. www.busybox.net, August 2008.
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    • August
    • Coreutils. www.gnu.org/software/coreutils, August 2008.
    • (2008)
  • 3
    • 77956563021 scopus 로고    scopus 로고
    • 1003.1, edition. May 2008
    • IEEE Std 1003.1, 2004 edition. www.unix.org/version3/ ieee std.html, May 2008.
    • (2004) IEEE Std
  • 4
    • 85076925013 scopus 로고    scopus 로고
    • August
    • MINIX 3. www.minix3.org, August 2008.
    • (2008)
  • 5
    • 72849149691 scopus 로고    scopus 로고
    • March
    • SecurityFocus, www.securityfocus.com, March 2008.
    • (2008) SecurityFocus
  • 6
    • 85076884310 scopus 로고    scopus 로고
    • May
    • uCLibc. www.uclibc.org, May 2008.
    • (2008)
  • 30
    • 18944390941 scopus 로고    scopus 로고
    • The model checker SPIN
    • HOLZMANN, G. J. The model checker SPIN. Software Engineering 23, 5 (1997), 279-295.
    • (1997) Software Engineering , vol.23 , Issue.5 , pp. 279-295
    • Holzmann, G.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.