Low-Energy photoemission study of C60/rubrene/au interfaces in practical device thickness

Applied Physics Express

Volumn 6, Issue 2, 2013, Pages

  Machida, Shin'ichi ^a   Ozawa, Yusuke ^a   Takahashi, Jun ichi ^b   Tokairin, Hiroshi ^b   Nakayama, Yasuo ^a   Ishii, Hisao ^a  

^a CHIBA UNIVERSITY   (Japan)

^b IDEMITSU KOSAN CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BACKGROUND SIGNALS; LOW ENERGY PHOTOEMISSION; LOW ENERGY PHOTONS; LOW-ENERGY PHOTOELECTRON SPECTROSCOPIES; MORPHOLOGICAL CHANGES; ORGANIC INTERFACES; ORGANIC SOLAR CELL; PHOTOELECTRON YIELD SPECTROSCOPY;

INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTONS;

INTERFACE STATES;

EID: 84875156995     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.6.025801     Document Type: Article

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