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Thin Solid Films

Volumn 391, Issue 1, 2001, Pages 81-87

Radiation induced degradation and surface charging of organic thin films in ultraviolet photoemission spectroscopy

(9) Koch, N a,e Pop, D c Weber, R L c Bowering N c Winter, B c Wick, M c Leising, G a,b Hertel, I V c Braun, W d

a JOANNEUM RESEARCH (Austria)

b GRAZ UNIVERSITY OF TECHNOLOGY (Austria)

c MAX BORN INSTITUT (Germany)

d HAHN MEITNER INSTITUT (Germany)

e Princeton University (United States)

Author keywords

Laser irradiation; Organic semiconductors; Photoelectron spectroscopy; Radiation damage

Indexed keywords

CHARGE CARRIERS; ELECTROLUMINESCENCE; ELECTRONIC STRUCTURE; IRRADIATION; LASER ABLATION; PHOTOEMISSION; SUBSTRATES; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; VACUUM APPLICATIONS;

ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY; VACUUM ULTRAVIOLET RADIATIONS;

SEMICONDUCTING FILMS;

EID: 0035796943 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)00961-0 Document Type: Article

Times cited : (45)

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