Two simple classroom demonstrations for scanning probe microscopy based on a macroscopic analogy

Journal of Chemical Education

Volumn 90, Issue 3, 2013, Pages 361-363

  Hajkova, Zdenka ^a   Fejfar, Antonin ^b   Smejkal, Petr ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

^b INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Analogies Transfer; Atomic Properties Structure; Demonstrations; First Year Undergraduate General; High School Introductory Chemistry; Interdisciplinary Multidisciplinary; Materials Science; Nanotechnology; Surface Science

Indexed keywords

EID: 84874987000     PISSN: 00219584     EISSN: None     Source Type: Journal    
DOI: 10.1021/ed3004947     Document Type: Article

References (16)

1. The Royal Society and The Royal Academy of Engineering. Nanoscience and Nanotechnologies: Opportunities and Uncertainties, 2004. Nanotechnology and Nanoscience. http://www.nanotec.org.uk/finalReport.htm (accessed Jan 2013).
2. Ashkenaz, D. E.; Hall, W. P.; Haynes, C. L.; Hicks, E. M.; McFarland, A. D.; Sherry, L. J.; Stuart, D. A.; Wheeler, K. E.; Yonzon, C. R.; Zhao, J.; Godwi, H. A.; Van Duyne, R. P. Coffee Cup Atomic Force Microscopy J. Chem. Educ. 2010, 87, 306-307
3. Campbell, D. J.; Olson, J. A.; Calderon, C. E.; Doolan, P. W.; Mengelt, E. A.; Ellis, A. B.; Lisensky, G. C. Chemistry with Refrigerator Magnets: From Modeling of Nanoscale Characterization to Composite Fabrication J. Chem. Educ. 1999, 76, 1205-1211
4. Campbell, D. J.; Miller, J. D.; Bannon, S. J.; Obermaier, L. M. An Exploration of the Nanoworld with LEGO Bricks J. Chem. Educ. 2011, 88, 602-606
5. Lorenz, J. K.; Olson, J. A; Campbell, D. J.; Lisensky, G. C.; Ellis, A. B. A Refrigerator Magnet Analog of Scanning-Probe Microscopy J. Chem. Educ. 1997, 74, 1032A-1032B
6. Bonson, K.; Headrick, R. L.; Hammond, D.; Hamblin, M. Working Model of an Atomic Force Microscope Am. J. Phys. 2011, 79, 189-192
7. Bosma, E.; Offerhaus, H. L.; van der Veen, J. T.; Segerink, F. B.; van Wessel, I. M. Large Scale Scanning Probe Microscope: Making the Shear-Force Scanning Visible Am. J. Phys. 2010, 78, 562-566
8. Planinsic, G.; Lindell, A.; Remskar, M. Themes of Nanoscience for the Introductory Physics Course Eur. J. Phys. 2009, 30, S17-S31
9. Greczyło, T.; Debowska, E. The Macroscopic Model of an Atomic Force Microscope in the Students' Laboratory Eur. J. Phys. 2006, 27, 501-513
10. Zypman, F. R.; Guerra-Vela, C. The Macroscopic Scanning Force 'Microscope' Eur. J. Phys. 2001, 22, 17-30
11. Guerra-Vela, C.; Zypman, F. R. The Poor Man's Scanning Force Microscope Eur. J. Phys. 2002, 23, 145-53
12. Planinsic, G.; Kovac, J. Nano Goes to School: A Teaching Model of the Atomic Force Microscope Phys. Educ. 2008, 43, 37-45
13. Gadia, V.; Patel, R.; Roy, S.; Singh, R.; Venkatesh, N.; Lunagaria, S.; Layton, B. E. An Educational Model of an Atomic Force Microscope The Nanotechnology Group 2005, 4, 1-8
14. Binnig, G.; Röhrer, H.; Gerber, C.; Weibel, E. Surface Studies by Scanning Tunneling Microscopy Phys. Rev. Lett. 1982, 49, 57-61
15. Binnig, G.; Quate, C. F.; Gerber, C. Atomic Force Microscope Phys. Rev. Lett. 1986, 56, 930-933
16. Atkins, P.; de Paula, J. The Intensities of Spectral Lines. Atkins' Physical Chemistry, 7 th ed.; Oxford University Press: New York, 2002; pp 491-494.