SCOPUS 정보 검색 플랫폼

Volumn 23, Issue 2, 2002, Pages 145-153

The poor man's scanning force microscope

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DYNAMOMETERS; KINEMATICS; NATURAL FREQUENCIES; SCANNING ELECTRON MICROSCOPY;

SCANNING FORCE MICROSCOPY (SFM);

SURFACE TOPOGRAPHY;

EID: 0036501778 PISSN: 01430807 EISSN: None Source Type: Journal
DOI: 10.1088/0143-0807/23/2/308 Document Type: Article

Times cited : (9)

References (7)

1
- 0008763123
- The macroscopic scanning force microscope
- (2001) Eur. J. Phys. , vol.22 , pp. 17-30
- Zypman, F.R.¹ Guerra-Vela, C.²

2
- 85178865956
- Improved algorithm to extract force-distance curves from scanning force microscope data
- ed L. Merhari et al. (Pittsburgh, PA: Materials Research Society)
- (2000) Materials Issues and Modeling for Device Nanofabrication , pp. 584
- Eppel, S.J.¹ Todd, B.A.² Zypman, F.R.³

3
- 11644257561
- High frequency response of a scanning force microscope cantilever
- (1998) J. Vac. Sci. Technol. B , vol.16 , pp. 2099
- Zypman, F.R.¹ Eppell, S.J.²

5
- 0008765620
- Electrostatic tip-surface interaction in scanning force microscopy: A convenient expression useful for arbitrary tip and sample geometries
- (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 1853
- Zypman, F.R.¹ Eppell, S.J.²

7
- 0003635359
- New York: Oxford University Press, equation (1.50); pp 12, 13, equations (1.56), (1.59)
- (1994) Scanning Force Microscopy revised edn , pp. 11
- Sarid, D.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.