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Volumn 78, Issue 6, 2010, Pages 562-566

Large scale scanning probe microscope: Making the shear-force scanning visible

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EID: 77953489210     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.3319657     Document Type: Article
Times cited : (5)

References (13)
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  • 6
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  • 10
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    • Atia, W.1    Davis, C.2
  • 11
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    • Atomic steps with tuning-fork-based noncontact atomic force microscopy
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    • Rensen W. van Hulst N. Ruiter A. West P. Atomic steps with tuning-fork-based noncontact atomic force microscopy. Appl. Phys. Lett. 1999, 75:1640-1642. APPLAB, 0003-6951, 10.1063/1.124780.
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    • Tuning fork tunes: Exploring new scanning probe techniques
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    • Introduction to the quartz tuning fork
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.