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American Journal of Physics
Volumn 79, Issue 2, 2011, Pages 189-192
Working model of an atomic force microscope
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Indexed keywords

EID: 79251508635     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.3531958     Document Type: Article
Times cited : (10)
References (8)
  • 1
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    • Binnig, G.1    Quate, C.F.2    Gerber, C.3
  • 2
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    • Scanning force microscopy of a cell sheath
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    • Mulhern P.J. Blackford B.L. Jericho M.H. Scanning force microscopy of a cell sheath. AIP Conf. Proc. 1991, 241:200-208. APCPCS, 0094-243X, 10.1063/1.41413.
    • (1991) AIP Conf. Proc. , vol.241 , pp. 200-208
    • Mulhern, P.J.1    Blackford, B.L.2    Jericho, M.H.3
  • 3
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    • An update on scanning force microscopies
    • ANCHAM, 0003-2700, 10.1021/ac00105a001
    • Louder D. Parkinson B. An update on scanning force microscopies. Anal. Chem. 1995, 67:297A-303A. ANCHAM, 0003-2700, 10.1021/ac00105a001.
    • (1995) Anal. Chem. , vol.67
    • Louder, D.1    Parkinson, B.2
  • 4
    • 4344602216 scopus 로고    scopus 로고
    • Realization of an optical profiler: Introduction to scanning probe microscopy
    • AJPIAS, 0002-9505, 10.1119/1.1648329.
    • Friedt J.M. Realization of an optical profiler: Introduction to scanning probe microscopy. Am. J. Phys. 2004, 72:1118-1125. AJPIAS, 0002-9505, 10.1119/1.1648329.
    • (2004) Am. J. Phys. , vol.72 , pp. 1118-1125
    • Friedt, J.M.1
  • 5
    • 0008763123 scopus 로고    scopus 로고
    • The macroscopic scanning force 'microscope'
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    • Zypman F. Geurra-Vela C. The macroscopic scanning force 'microscope'. Eur. J. Phys. 2001, 22:17-30. EJPHD4, 0143-0807, 10.1088/0143-0807/22/1/303.
    • (2001) Eur. J. Phys. , vol.22 , pp. 17-30
    • Zypman, F.1    Geurra-Vela, C.2
  • 6
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    • The poor man's scanning force microscope
    • EJPHD4, 0143-0807, 10.1088/0143-0807/23/2/308
    • Guerra-Vela C. Zypman F. The poor man's scanning force microscope. Eur. J. Phys. 2002, 23:145-153. EJPHD4, 0143-0807, 10.1088/0143-0807/23/2/308.
    • (2002) Eur. J. Phys. , vol.23 , pp. 145-153
    • Guerra-Vela, C.1    Zypman, F.2
  • 7
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    • The macroscopic model of an atomic force microscope in the students' laboratory
    • EJPHD4, 0143-0807, 10.1088/0143-0807/27/3/004
    • Greczyło T. Debowska E. The macroscopic model of an atomic force microscope in the students' laboratory. Eur. J. Phys. 2006, 27:501-513. EJPHD4, 0143-0807, 10.1088/0143-0807/27/3/004.
    • (2006) Eur. J. Phys. , vol.27 , pp. 501-513
    • Greczyło, T.1    Debowska, E.2
  • 8
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    • A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
    • JAPIAU, 0021-8979, 10.1063/1.352149
    • Putman C.A. J. De Grooth B.G. Van Hulst N.F. Greve J. A detailed analysis of the optical beam deflection technique for use in atomic force microscopy. J. Appl. Phys. 1992, 72:6-12. JAPIAU, 0021-8979, 10.1063/1.352149.
    • (1992) J. Appl. Phys. , vol.72 , pp. 6-12
    • Putman C.A., J.1    De Grooth, B.G.2    Van Hulst, N.F.3    Greve, J.4

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.