메뉴 건너뛰기




Volumn 27, Issue 3, 2006, Pages 501-513

The macroscopic model of an atomic force microscope in the students' laboratory

Author keywords

[No Author keywords available]

Indexed keywords

EDUCATION; LABORATORIES; MATHEMATICAL MODELS; STUDENTS; SURFACE TOPOGRAPHY;

EID: 33646341777     PISSN: 01430807     EISSN: 13616404     Source Type: Journal    
DOI: 10.1088/0143-0807/27/3/004     Document Type: Article
Times cited : (15)

References (9)
  • 2
    • 35949012856 scopus 로고
    • Scanning tunneling microscopy-from birth to adolescence
    • Binnig G and Rohrer H 1987 Scanning tunneling microscopy-from birth to adolescence Rev. Mod. Phys. 59 615-25
    • (1987) Rev. Mod. Phys. , vol.59 , Issue.3 , pp. 615-625
    • Binnig, G.1    Rohrer, H.2
  • 3
    • 0008763123 scopus 로고    scopus 로고
    • The microscopic scanning force 'microscope'
    • Zypman F R and Guerra-Vela C 2001 The microscopic scanning force 'microscope' Eur. J. Phys. 22 17-30
    • (2001) Eur. J. Phys. , vol.22 , Issue.1 , pp. 17-30
    • Zypman, F.R.1    Guerra-Vela, C.2
  • 4
    • 0036501778 scopus 로고    scopus 로고
    • The poor man's scanning force microscope
    • Guerra-Vela C and Zypman F R 2002 The poor man's scanning force microscope Eur. J. Phys. 23 145-53
    • (2002) Eur. J. Phys. , vol.23 , Issue.2 , pp. 145-153
    • Guerra-Vela, C.1    Zypman, F.R.2
  • 5
    • 0001071771 scopus 로고    scopus 로고
    • A direct method to calculate tip-sample forces from frequency shift in frequency-modulation atomic force microscopy
    • Giessibl F J 2001 A direct method to calculate tip-sample forces from frequency shift in frequency-modulation atomic force microscopy Appl. Phys. Lett. 78 123-5
    • (2001) Appl. Phys. Lett. , vol.78 , Issue.1 , pp. 123-125
    • Giessibl, F.J.1
  • 8
    • 85178867753 scopus 로고    scopus 로고
    • 2000 Guide to Coach 5 CMA/Amstel Institute, Amsterdam
    • (2000) Guide to Coach 5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.