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Volumn 5, Issue 1, 2013, Pages

Effects of sulphur and air annealing on the properties of thermally evaporated SnS layers for application in thin film solar cell devices

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE MEASUREMENTS; FREQUENCY MEASUREMENTS; HETEROJUNCTION DEVICES; INTERFACE TRAP DENSITY; SPECTRAL RESPONSE; THERMAL EVAPORATION METHOD; THIN FILM SOLAR CELLS; X RAY DIFFRACTOMETERS;

EID: 84874926117     PISSN: 19417012     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4791784     Document Type: Conference Paper
Times cited : (14)

References (22)
  • 3
    • 84874884335 scopus 로고
    • Powder Diffraction File 00-039-0354
    • Powder Diffraction File 00-039-0354 (1985).
    • (1985)
  • 9
    • 0020940620 scopus 로고
    • 10.1088/0022-3735/16/12/023
    • R. Swanepoel, J. Phys. E 16, 1214 (1983). 10.1088/0022-3735/16/12/023
    • (1983) J. Phys. e , vol.16 , pp. 1214
    • Swanepoel, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.