Electron backscatter diffraction investigation of local misorientations and orientation gradients in connection with evolution of grain boundary structures in deformed and annealed zirconium. A new approach in grain boundary analysis

Journal of Applied Crystallography

Volumn 46, Issue 2, 2013, Pages 483-492

  Jedrychowski, Mariusz ^a,b   Tarasiuk, Jacek ^a   Bacroix, Brigitte ^b   Wronski, Sebastian ^a,b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b CNRS   (France)

Author keywords

electron backscatter diffraction (EBSD); grain boundaries; grain orientation spread (GOS); kernel average misorientation (KAM); local misorientations; microstructure; texture; thermomechanical treatment; zirconium

Indexed keywords

ELECTRON BACK SCATTER DIFFRACTION; GRAIN BOUNDARY CHARACTERIZATION; GRAIN ORIENTATION; HIGH ANGLE GRAIN BOUNDARIES; KERNEL AVERAGE MISORIENTATION (KAM); LOW ANGLE GRAIN BOUNDARIES; MISORIENTATIONS; PARTIAL RECRYSTALLIZATION;

ELECTRON DIFFRACTION; MICROSTRUCTURAL EVOLUTION; MICROSTRUCTURE; TEXTURES; THERMOMECHANICAL TREATMENT; ZIRCONIUM;

GRAIN BOUNDARIES;

EID: 84874888029     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812052016     Document Type: Article

References (28)

1. Bacroix, B. & Brenner, R. (2012). Comput. Mater. Sci. 54, 97-100.
2. Bunge, H. J. (1982). Texture Analysis in Materials Science - Mathematical Methods. London: Butterworths.
3. Cabus, C., Réglé, H. & Bacroix, B. (2007). Mater. Charact. 58, 332-338.
4. Calcagnotto, M., Ponge, D., Demir, E. & Raabe, D. (2010). Mater. Sci. Eng. A, 527, 2738-2746.
5. Chun, Y. B. & Hwang, S. K. (2008). Acta Mater. 56, 369-379.
6. Chun, Y. B., Semiatin, S. L. & Hwang, S. K. (2005). Mater. Sci. Forum, 495-497, 651-656.
7. Dziaszyk, S., Payton, E. J., Friedel, F., Marx, V. & Eggeler, G. (2010). Mater. Sci. Eng. A, 527, 7854-7864.
8. Engler, O. (2001). Acta Metall. Mater. 49, 1237-1247.
9. Francillette, H., Bacroix, B., Gasperini, M. & Bechade, J. L. (1998). Acta Mater. 46, 4131-4142.
10. Gerber, P., Tarasiuk, J. & Bacroix, B. (2002). Mater. Sci. Forum, 408-412, 857-862.
11. Gerber, P., Tarasiuk, J., Chiron, R. & Bacroix, B. (2005). Arch. Metall. Mater. 50, 747-755.
12. Hansen, N. & Juul Jensen, D. (1999). Philos. Trans. R. Soc. London Ser. A, 357, 1447-1469.
13. Kamaya, M. (2006). Acta Mater. 54, 539-548.
14. Kamaya, M. (2009). Mater. Charact. 60, 1454-1462.
15. Kamaya, M. (2011). Ultramicroscopy, 111, 1189-1199.
16. Kamaya, M. (2012). Mater. Charact. 66, 56-67.
17. Kang, J.-Y., Bacroix, B. & Brenner, R. (2012). Scr. Mater. 66, 654-657.
18. Kang, J.-Y., Bacroix, B., Réglé, H., Oh, K. H. & Lee, H.-C. (2007). Acta Mater. 55, 4935-4946.
19. Kumar, M. & Schuh, C. A. (2006). Editors. Scr. Mater. 54, 961-962.
20. Lu, H., Sivaprasad, P. & Davies, C. (2003). Mater. Charact. 51, 293-300.
21. Miroux, A., Badea, L., Arizmendi, D., Bacroix, B. & Raphanel, J. L. (1999). Arch. Metall. Mater. 44, 241-252.
22. TexSEM Laboratories (2004). OIM Analysis For Windows, User Manual. TexSEM Laboratories (TSL) Inc., Draper, UT, USA.
23. Pie{ogonek}koś, K., Tarasiuk, J., Wierzbanowski, K. & Bacroix, B. (2008). Comput. Mater. Sci. 42, 584-594.
24. Randle, V. (2004). Acta Mater. 52, 4067-4081.
25. Takayama, Y. & Szpunar, J. A. (2004). Mater. Trans. 45, 2316-2325.
26. Wierzbanowski, K., Tarasiuk, J., Bacroix, B., Sztwiertnia, K. & Gerber, P. (2003). Met. Mater. Int. 9, 9-14.
27. Zhu, K. Y., Chaubet, D., Bacroix, B. & Brisset, F. (2005). Acta Mater. 53, 5131-5140.
28. Zhu, K. Y., Bacroix, B., Chauveau, T., Chaubet, D. & Castelnau, O. (2009). Met. Mater. Trans. A, 40, 2423-2434.