Characterization of microstructural damage due to low-cycle fatigue by EBSD observation

Materials Characterization

Volumn 60, Issue 12, 2009, Pages 1454-1462

  Kamaya, Masayuki ^a  

^a INSTITUTE OF NUCLEAR SAFETY SYSTEM   (Japan)

Author keywords

Electron backscatter diffraction (EBSD); Low cycle fatigue; Misorientation; Plastic deformation; Stainless steel

Indexed keywords

DEGREE OF LOCALIZATION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION (EBSD); FORM CLUSTERS; LOADING DIRECTION; LOW CYCLE FATIGUES; LOW-CYCLE FATIGUE; MEASURED DATA; MICROSTRUCTURAL DAMAGE; MISORIENTATION; MISORIENTATION ANGLE; NEIGHBORING POINT; SPATIAL DISTRIBUTION; STATISTICAL PROCESSING; STRAIN AMPLITUDE; TENSILE TESTS; TYPE 316 STAINLESS STEEL;

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; FATIGUE DAMAGE; GRAIN BOUNDARIES; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY; TENSILE TESTING;

STAINLESS STEEL;

EID: 70350573367     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2009.07.003     Document Type: Article

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