Treatment of misorientation data to determine the fraction of recrystallized grains in a partially recrystallized metal

Materials Characterization

Volumn 51, Issue 5, 2003, Pages 293-300

  Lu, H ^a   Sivaprasad, P ^a   Davies, C H J ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Annealing; EBSD; Electron backscattered diffraction; Recrystallization

Indexed keywords

ANNEALING; CALIBRATION; COMPUTER AIDED ANALYSIS; CRYSTALLOGRAPHY; DATA ACQUISITION; ELECTRON DIFFRACTION; IMAGING SYSTEMS; METALLOGRAPHIC MICROSTRUCTURE; METALLOGRAPHY; MICROHARDNESS; MICROSCOPES; RECRYSTALLIZATION (METALLURGY); X RAY DIFFRACTION;

ELECTRON BACKSCATTERED DIFFRACTION (EBSD); MICROHARDNESS MEASUREMENT; MISORIENTATION;

GRAIN SIZE AND SHAPE;

EID: 2342473904     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.01.005     Document Type: Article

References (11)

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