Characterization of insertion loss and back reflection in passive hybrid silicon tapers

IEEE Photonics Journal

Volumn 5, Issue 2, 2013, Pages

  Kurczveil, Géza ^a,b   Pintus, Paolo ^a,c   Heck, Martijn J R ^a   Peters, Jonathan D ^a   Bowers, John E ^a  

^a University of California   (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

^c SCUOLA SUPERIORE SANT ANNA   (Italy)

Author keywords

optical amplifiers; Optoelectronics; photonic integrated circuits; semiconductor lasers

Indexed keywords

ACTIVE LAYER; BACK REFLECTION; HYBRID SILICON; MODE MISMATCH; OPTICAL MODES; OPTICAL SCATTERING; PHOTONIC INTEGRATED CIRCUITS; SILICON WAVEGUIDE;

LIGHT AMPLIFIERS; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; SEMICONDUCTOR LASERS; WAVEGUIDES;

SILICON;

EID: 84874822763     PISSN: 19430655     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOT.2013.2246559     Document Type: Article

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