Roughness induced backscattering in optical silicon waveguides

Physical Review Letters

Volumn 104, Issue 3, 2010, Pages

  Morichetti, Francesco ^a   Canciamilla, Antonio ^a   Ferrari, Carlo ^a   Torregiani, Matteo ^a   Melloni, Andrea ^a   Martinelli, Mario ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT OBSERVATION; HIGH INDEX CONTRAST OPTICAL WAVEGUIDES; HIGHER-ORDER MODES; INTEGRATED PHOTONICS; LIMITING FACTORS; OPTICAL PARAMETER; POLARIZATION ROTATION; SIDEWALL ROUGHNESS; SILICON ON INSULATOR; SILICON WAVEGUIDE; STATE OF THE ART; TOTAL INTERNAL REFLECTIONS;

OPTICAL WAVEGUIDES; REFRACTIVE INDEX; WAVEGUIDES;

BACKSCATTERING;

EID: 74949124738     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.033902     Document Type: Article

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