SCOPUS 정보 검색 플랫폼

Volumn 530, Issue , 2013, Pages 120-124

Strain inhomogeneity in copper islands probed by coherent X-ray diffraction

(12) Beutier, G a Verdier, M a Parry, G a Gilles, B a Labat, S b Richard, M I b Cornelius, T c Lory, P F a Vu Hoang, S a Livet, F a Thomas, O b De Boissieu, M a

a GRENOBLE INSTITUTE OF TECHNOLOGY (France)

b AIX MARSEILLE UNIVERSITY (France)

c EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

Coherent X ray diffraction; Copper; Nanostructures; Strain field

Indexed keywords

COHERENT X-RAY DIFFRACTION; DIFFRACTION DATA; FINITE ELEMENT MODELLING; ISLAND SHAPE; RESIDUAL STRAINS; STRAIN EFFECT; STRAIN FIELDS; STRAIN INHOMOGENEITY; THERMAL MISMATCH;

COPPER; FINITE ELEMENT METHOD; NANOSTRUCTURES;

X RAY DIFFRACTION;

EID: 84874781860 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2012.02.032 Document Type: Conference Paper

Times cited : (11)

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