On X-ray diffraction study of preferred grain orientations in polycrystalline thin films - Multicomponent texture in KTaO3 films

Thin Solid Films

Volumn 530, Issue , 2013, Pages 2-8

  Kuzel R ^a   Bursik J ^b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b INSTITUTE OF INORGANIC CHEMISTRY   (Czech Republic)

Author keywords

Fast texture characterization; Fiber texture; Multicomponent texture; X ray diffraction

Indexed keywords

ANGLE OF INCIDENCE; DETECTOR SCAN; FIBER TEXTURE; GRAZING INCIDENCE; MICROSTRUCTURAL FEATURES; MULTICOMPONENTS; NARROW DISTRIBUTION; ORIENTED DOMAINS; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; PREFERRED GRAIN ORIENTATIONS; PT(111); SINGLE CRYSTALLINE SUBSTRATES; TEXTURE CHARACTERIZATIONS; TEXTURE COMPONENTS; THIN FILM ANALYSIS; X-RAY DIFFRACTION STUDIES;

MICROSTRUCTURAL EVOLUTION; THIN FILMS; X RAY DIFFRACTION;

TEXTURES;

EID: 84874779570     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.07.057     Document Type: Conference Paper

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