Analysis of defect formation in semiconductor cryogenic bolometric detectors created by heavy dark matter

Astroparticle Physics

Volumn 44, Issue , 2013, Pages 9-14

  Lazanu, Ionel ^a   Ciurea, Magdalena Lidia ^b   Lazanu, Sorina ^b  

^a UNIVERSITY OF BUCHAREST   (Romania)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

Dark matter; Defects; Detectors; Low temperature; Semiconductors; WIMP

Indexed keywords

CRYOGENIC BOLOMETRIC DETECTORS; CRYOGENIC DETECTORS; CRYOGENIC TEMPERATURES; DARK MATTER; DARK MATTER PARTICLES; DEFECT FORMATION; FRENKEL PAIRS; LOW TEMPERATURES; LUKE EFFECT; NEW FORMS; SEMICONDUCTOR LATTICES; THERMAL SIGNALS; WEAKLY INTERACTING MASSIVE PARTICLES; WIMP;

BOLOMETERS; CRYOGENICS; DEPOSITS; DETECTORS; GALAXIES; GERMANIUM; SEMICONDUCTOR MATERIALS; SILICON;

DEFECTS;

EID: 84874745644     PISSN: 09276505     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.astropartphys.2013.01.005     Document Type: Article

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