Calibrating atomic-scale force sensors installed at the tip apex of a scanning tunneling microscope

Physical Review B - Condensed Matter and Materials Physics

Volumn 87, Issue 8, 2013, Pages

  Kichin, G ^a,b   Wagner, C ^a,b   Tautz, F S ^a,b   Temirov, R ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b Section JARA FIT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84874524695     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.081408     Document Type: Article

References (17)

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7. The absolute distance between the tip and the surface is not known from the experiment. Instead, we use a relative tip-surface distance scale z. The value of z is defined as the distance by which the tip is approached from its stabilization point towards the surface prior to the respective constant height scan. Although the tip was always stabilized at the same lateral location, the actual tip-surface distance is expected to vary between the different tips. Therefore, the absolute values of the z scales in Figs., and are not directly comparable.
8. 0 was taken to be equal to 1800 N / m (Ref.).
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