Interaction of surface and interface plasmons in extremely thin Al films on Si(111)

Applied Physics Letters

Volumn 102, Issue 5, 2013, Pages

  Qin, Huajun ^a   Jiang, Ying ^a   Zhang, Guanhua ^a   Wu, Kehui ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AL FILMS; AL THIN FILMS; ANGLE-RESOLVED; CLASSICAL MODEL; ELECTRONIC EXCITATION; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; INTERFACE PLASMONS; MONOATOMIC LAYER; SI (1 1 1); SURFACE AND INTERFACES; SURFACE PLASMON EXCITATION; SURFACE PLASMON MODES; SURFACE PLASMONS;

ALUMINUM; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY;

PLASMONS;

EID: 84874096099     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790289     Document Type: Article

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