Growing extremely thin bulklike metal film on a semiconductor surface: Monolayer Al(111) on Si(111)

Applied Physics Letters

Volumn 91, Issue 18, 2007, Pages

  Jiang, Ying ^a   Kim, Yong Hyun ^b   Zhang, S B ^b   Ebert, Philipp ^c   Yang, Shenyuan ^a   Tang, Zhe ^a   Wu, Kehui ^a   Wang, E G ^a  

^a INSTITUTE OF PHYSICS   (China)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

FLAT FILM; METALLIC CHARACTERISTICS; SUBSTRATE RECONSTRUCTION;

ULTRATHIN FILMS;

EID: 35649012709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2804010     Document Type: Article

References (20)

1. F. K. Schulte, Surf. Sci. 55, 427 (1976).
2. M. Jalochowski, E. Bauer, H. Knoppe, and G. Lilienkamp, Phys. Rev. B 45, 13607 (1992).
3. Z. Zhang, Q. Niu, and C. K. Shih, Phys. Rev. Lett. 80, 5381 (1998).
4. Y. Guo, Y. F. Zhang, X. Y. Bao, T. Z. Han, Z. Tang, L. X. Zhang, W. G. Zhu, E. G. Wang, Q. Niu, Z. Q. Qiu, J. F. Jia, Z. X. Zhao, and Q. K. Xue, Science 306, 1915 (2004).
5. D. Eom, S. Qin, M. Y. Chou, and C. K. Shih, Phys. Rev. Lett. 96, 027005 (2006).
6. L. Aballe, A. Barinov, A. Locatelli, S. Heun, and M. Kiskinova, Phys. Rev. Lett. 93, 196103 (2004).
7. B. C. H. Steele, and A. Heinzel, Nature (London) 414, 345 (2001).
8. W. L. Barnes, A. Dereux, and T. W. Ebbesen, Nature (London) 424, 824 (2003).
9. A. J. Slavin, Prog. Surf. Sci. 50, 159 (1995).
10. A. R. Smith, K. J. Chao, Q. Niu, and C. K. Shih, Science 273, 226 (1996).
11. L. Gavioli, K. R. Kimberlin, M. C. Tringides, J. F. Wendelken, and Z. Zhang, Phys. Rev. Lett. 82, 129 (1998).
12. W. B. Su, S. H. Chang, W. B. Jian, C. S. Chang, L. J. Chen, and T. T. Tsong, Phys. Rev. Lett. 86, 5116 (2001).
13. A. Zur and T. C. McGill, J. Appl. Phys. 55, 378 (1984).
14. H. Liu, Y. F. Zhang, D. Y. Wang, M. H. Pan, J. F. Jia, and Q. K. Xue, Surf. Sci. 571, 5 (2004).
15. Y. Jiang, K. H. Wu, Z. Tang, P. Ebert, and E. G. Wang, Phys. Rev. B 76, 035409 (2007).
16. R. J. Hamers, Phys. Rev. B 40, 1657 (1989).
17. For the total energy calculation, we used the VASP codes with PAW potentials [G. Kresse and J. Joubert, Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.1758 59, 1758 (1999)]. The energy cutoff for the wavefunction expansion was 300 eV, and the Perdew-Burke-Ernzerhof exchange-correlation functional [J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.77.3865 77, 3865 (1996)] was used. To study surfaces, we used a slab with eight Si(111) double layers and a vacuum of 15 Å thickness. For the Brillouin-zone integration, we used the (12×12×1), (8×8×1), and (4×4×1) k -point sets in the M-P scheme [H. J. Monkhorst and J. D. Pack, Phys. Rev. B 13, 5188 (1976)] for Si 1×1, 3×3, and Al-1×1 surfaces, respectively.
18. For the total energy calculation, we used the VASP codes with PAW potentials [G. Kresse and J. Joubert, Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.1758 59, 1758 (1999)]. The energy cutoff for the wavefunction expansion was 300 eV, and the Perdew-Burke-Ernzerhof exchange-correlation functional [J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.77.3865 77, 3865 (1996)] was used. To study surfaces, we used a slab with eight Si(111) double layers and a vacuum of 15 Å thickness. For the Brillouin-zone integration, we used the (12×12×1), (8×8×1), and (4×4×1) k -point sets in the M-P scheme [H. J. Monkhorst and J. D. Pack, Phys. Rev. B 13, 5188 (1976)] for Si 1×1, 3×3, and Al-1×1 surfaces, respectively.
19. For the total energy calculation, we used the VASP codes with PAW potentials [G. Kresse and J. Joubert, Phys. Rev. B 0163-1829 10.1103/PhysRevB.59.1758 59, 1758 (1999)]. The energy cutoff for the wavefunction expansion was 300 eV, and the Perdew-Burke-Ernzerhof exchange-correlation functional [J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.77.3865 77, 3865 (1996)] was used. To study surfaces, we used a slab with eight Si(111) double layers and a vacuum of 15 Å thickness. For the Brillouin-zone integration, we used the (12×12×1), (8×8×1), and (4×4×1) k -point sets in the M-P scheme [H. J. Monkhorst and J. D. Pack, Phys. Rev. B 13, 5188 (1976)] for Si 1×1, 3×3, and Al-1×1 surfaces, respectively.
20. J. E. Northrup, Phys. Rev. Lett. 53, 683 (1984).