X-ray diffraction and raman spectroscopy study of strain in graphene films grown on 6H-SiC(0001) using propane-hydrogen-argon CVD

Materials Science Forum

Volumn 740-742, Issue , 2013, Pages 117-120

  Michon, Adrien ^a   Largeau, Ludovic ^b   Tiberj, Antoine ^c   Huntzinger, Jean Roch ^c   Mauguin, Olivia ^b   Vézian, Stéphane ^a   Lefebvre, Denis ^a   Cheynis, Fabien ^d   Leroy, Frédéric ^d   Müller, Pierre ^d   Chassagne, Thierry ^e   Zielinski, Marcin ^e   Portail, Marc ^a  

^a CRHEA CNRS   (France)

^b UNIV PARIS SUD   (France)

^c UNIVERSITÉ MONTPELLIER 2   (France)

^d AIX MARSEILLE UNIVERSITY   (France)

^e SAVOIE TECHNOLAC   (France)

Author keywords

CVD; Graphene; Hydrogen; Propane; SiC; Strain

Indexed keywords

ARGON; CHEMICAL VAPOR DEPOSITION; GRAPHENE; HYDROGEN; MIXTURES; PHASE INTERFACES; PROPANE; RAMAN SPECTROSCOPY; STRAIN; X RAY DIFFRACTION;

CARRIER GAS; GRAPHENE FILMS; GRAPHENE LAYERS; GRAZING INCIDENCE X-RAY DIFFRACTION;

SILICON CARBIDE;

EID: 84874088500     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.740-742.117     Document Type: Conference Paper

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