Hierarchical multi-task learning with application to wafer quality prediction

Proceedings - IEEE International Conference on Data Mining, ICDM

Volumn , Issue , 2012, Pages 290-298

  He, Jingrui ^a   Zhu, Yada ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Hierarchical multi task learning; Task relatedness; Wafer quality

Indexed keywords

BLOCK COORDINATE DESCENTS; COEFFICIENT VECTOR; DOCUMENT CLASSIFICATION; INPUT FEATURES; MULTIPLE-GROUP; MULTITASK LEARNING; OPTIMIZATION FRAMEWORK; PREDICTION MODEL; REAL PROBLEMS; SEMICONDUCTOR MANUFACTURING; SYNTHETIC AND REAL DATA; TASK CLUSTERING; TASK RELATEDNESS; WAFER QUALITY;

CLASSIFICATION (OF INFORMATION); INFORMATION RETRIEVAL SYSTEMS; SEMICONDUCTOR DEVICE MANUFACTURE;

DATA MINING;

EID: 84874061480     PISSN: 15504786     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDM.2012.63     Document Type: Conference Paper

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