Argon broad ion beam tomography in a cryogenic scanning electron microscope: A novel tool for the investigation of representative microstructures in sedimentary rocks containing pore fluid

Journal of Microscopy

Volumn 249, Issue 3, 2013, Pages 215-235

  Desbois, G ^a   Urai, J L ^a   Perez Willard F ^b   Radi, Z ^c   Offern, S ^d   Burkart, I ^d   Kukla, P A ^a   Wollenberg, U ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b CARL ZEISS SMT AG   (Germany)

^c Technoorg Linda Ltd Co   (Hungary)

^d Klocke Nanotechnik GmbH   (Germany)

Author keywords

Broad ion beam; Cryogeny; Geomaterials; Microstructures; Pore fluids; Rock salt; SEM; Tomography

Indexed keywords

ARGON; CRYOGENICS; DAMAGE DETECTION; IMAGING SYSTEMS; IONS; MICROSTRUCTURE; PORE FLUIDS; SALT DEPOSITS; SCANNING ELECTRON MICROSCOPY; SEDIMENTOLOGY; SHALE; SODIUM CHLORIDE; TOMOGRAPHY;

BROAD ION BEAM; CRYOGENIC TEMPERATURES; CRYOGENY; GEOMATERIALS; ION BEAM SCANNING; PORE FLUIDS; ROCK SALT; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS; X-RAY TOMOGRAPHY;

ION BEAMS;

ARGON; SODIUM CHLORIDE;

ARGON BROAD ION BEAM TOMOGRAPHY; ARTICLE; BROAD ION BEAM; CHEMICAL ANALYSIS; CRYOGENIC SCANNING ELECTRON MICROSCOPY; PRIORITY JOURNAL; ROCK; SCANNING ELECTRON MICROSCOPY; SEDIMENTARY ROCK; TEMPERATURE; TOMOGRAPHY; X RAY; X RAY TOMOGRAPHY;

EID: 84873733140     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12011     Document Type: Article

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