High-definition differential ion mobility spectrometry with resolving power up to 500

Journal of the American Society for Mass Spectrometry

Volumn 24, Issue 1, 2013, Pages 109-114

  Shvartsburg, Alexandre A ^a   Seim, Tom A ^a   Danielson, William F ^a   Norheim, Randy ^a   Moore, Ronald J ^a   Anderson, Gordon A ^a   Smith, Richard D ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Differential IMS; FAIMS; High resolution analyses; Ion mobility spectrometry

Indexed keywords

ANALYTICAL METHOD; COMPENSATION VOLTAGE; DIFFERENTIAL IMS; FAIMS; GAS PRESSURES; HIGH DEFINITION; HIGH RESOLUTION ANALYSIS; INSTRUMENTAL PARAMETERS; ION MOBILITY SPECTROMETRY; PEAK WIDTHS;

SPECTROMETRY;

IONS;

HELIUM; HYDROGEN; NITROGEN; PEPTIDE;

ACCURACY; ANALYTICAL PARAMETERS; ARTICLE; DIFFERENTIAL ION MOBILITY SPECTROMETRY; ELECTRIC POTENTIAL; GAS PRESSURE; GENERATOR; IMAGE QUALITY; ION MOBILITY SPECTROMETRY; PHYSICAL CHEMISTRY; PRESSURE;

GASES; ISOMERISM; MASS SPECTROMETRY; PEPTIDES;

EID: 84873031667     PISSN: 10440305     EISSN: 18791123     Source Type: Journal    
DOI: 10.1007/s13361-012-0517-5     Document Type: Article

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