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Volumn 6, Issue 6, 2000, Pages 481-490

High-resolution electrospray ionization orthogonal-injection time-of-flight mass spectrometer

Author keywords

Acceptance; Electrospray; High resolution; Injection; Mass spectrometer; Orthogonal; Phase volume; Reflectron; Time of flight

Indexed keywords


EID: 0034563289     PISSN: 14690667     EISSN: None     Source Type: Journal    
DOI: 10.1255/ejms.378     Document Type: Article
Times cited : (96)

References (24)
  • 1
    • 84947427899 scopus 로고
    • prepared by the Bendix Corporation Research Laboratories Division, Southfield (Contract Nos AF33(616)-8374 and AF33(657)-11018, A.F. Materials Laboratory Research and Technology Division, Air Force Systems Command)
    • G.J. O'Halloran, R.A. Fluegge, J.F. Betts and W.J. Everett, Technical Report prepared by the Bendix Corporation Research Laboratories Division, Southfield (Contract Nos AF33(616)-8374 and AF33(657)-11018, A.F. Materials Laboratory Research and Technology Division, Air Force Systems Command) (1964).
    • (1964) Technical Report
    • O'Halloran, G.J.1    Fluegge, R.A.2    Betts, J.F.3    Everett, W.J.4
  • 12
    • 0005456772 scopus 로고
    • Time-of-flight Mass Spectrometry
    • Ed by R.J. Cotter. American Chemical Society, Washington, DC
    • A.F. Dodonov, I.V. Chernushevich and V.V. Laiko, in Time-of-flight Mass Spectrometry, Ed by R.J. Cotter. ACS Symposium Series, American Chemical Society, Washington, DC, p. 108 (1994).
    • (1994) ACS Symposium Series , pp. 108
    • Dodonov, A.F.1    Chernushevich, I.V.2    Laiko, V.V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.