Data-driven quality related prediction and monitoring

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2012, Pages 3874-3879

  Yin, Shen ^a   Wei, Zuolong ^a   Gao, Huijun ^a   Peng, Kaixiang ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Data driven methods; fault diagnosis and prediction; modified partial least squares; quality or key performance indicator related; subspace aided approach

Indexed keywords

DATA-DRIVEN APPROACH; DATA-DRIVEN METHODS; HOT STRIP MILLS; KEY PERFORMANCE INDICATORS; LARGE-SCALE INDUSTRIAL PROCESS; MODIFIED PARTIAL LEAST SQUARES; OBSERVER-BASED RESIDUAL GENERATORS; OPERATING CONDITION; PARTIAL LEAST SQUARE (PLS); SOFT SENSORS; SUBSPACE AIDED APPROACH;

BENCHMARKING; INDUSTRIAL APPLICATIONS; INDUSTRIAL ELECTRONICS;

FORECASTING;

EID: 84872962459     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2012.6389273     Document Type: Conference Paper

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