A statistical interpretation of molecular delta layer depth profiles

Surface and Interface Analysis

Volumn 45, Issue 1, 2013, Pages 39-41

  Wucher, A ^a   Krantzman, K D ^b   Lu, C ^c   Winograd, N ^c  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b Department of Teacher Education and Department of Sociology and Anthropology   (United States)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

delta layers; depth resolution; molecular depth profiling; response function; statistical sputtering model

Indexed keywords

DELTA LAYERS; DEPTH RESOLUTION; MOLECULAR DEPTH PROFILING; RESPONSE FUNCTIONS; SPUTTERING MODELS;

SURFACE ANALYSIS; SURFACES;

MOLECULAR DYNAMICS;

EID: 84872871216     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4966     Document Type: Conference Paper

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