Measurement of UV from a microplasma by a microfabricated amorphous selenium detector

IEEE Transactions on Electron Devices

Volumn 60, Issue 2, 2013, Pages 880-883

  Abbaszadeh, Shiva ^a   Karim, Karim S ^a   Karanassios, Vassili ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

Amorphous selenium (a Se); metal semiconductor metal detector; microplasma; ultraviolet (UV) detector

Indexed keywords

AMORPHOUS SELENIUM; BLOCKING LAYERS; CHARGE COUPLED DEVICE DETECTORS; DEVICE STRUCTURES; EMISSION SIGNAL; HIGH ELECTRIC FIELDS; LIGHT-SENSITIVE LAYERS; METAL-SEMICONDUCTOR-METAL DETECTORS; MICRO-PLASMAS; MICROFABRICATED; NANOGRAMS; RESPONSIVITY; ROOM TEMPERATURE; SPECTRAL RESPONSE; ULTRA-VIOLET; ULTRAVIOLET PHOTON;

ELECTRIC FIELDS; LIGHT SOURCES; METAL DETECTORS; METAMATERIALS; PHOTONS; SELENIUM;

PLASMA DEVICES;

EID: 84872857004     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2012.2231682     Document Type: Article

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