Tungstate formation in a model scandate thermionic cathode

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 31, Issue 1, 2013, Pages

  Wan, Congshang ^a   Kordesch, Martin E ^a  

^a OHIO UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION MICROSCOPES; OPTICAL MICROSCOPY; RAMAN SPECTROSCOPY; THERMIONIC CATHODES; THERMIONIC EMISSION; THIN FILMS;

BULK OXIDES; CATHODE LIFE; CRYSTALLINE COMPOUNDS; EMISSION AREA; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; LONG CHAINS; SCANDATES; THERMIONIC ELECTRON EMISSION;

TUNGSTEN COMPOUNDS;

EID: 84872694599     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.4772007     Document Type: Article

References (38)

1. J. M. Vaughn, K. D. Jamison, and M. E. Kordesch, Proc. Mater. Res. Soc., Symposium W, 1088-W03-09 (2008).
2. J. M. Vaughn, K. D. Jamison, and M. E. Kordesch, IEEE Trans. Electron. Dev. 56, 794 (2009). 10.1109/TED.2009.2015410
3. J. M. Vaughn, Ph.D. dissertation (Ohio University, Athens, 2010).
4. M. E. Kordesch, J. M. Vaughn, C. Wan, and K. D. Jamison, J. Vac. Sci. Technol. B 29, 04E102 (2011). 10.1116/1.3589442
5. J. M. Vaughn, C. Wan, K. D. Jamison, and M. E. Kordesch, IBM J. Res. Dev. 55, 14:1 (2011). 10.1147/JRD.2011.2159423
6. C. Wan, J. M. Vaughn, J. T. Sadowski, and M. E. Kordesch, Ultramicroscopy 119, 106 (2012). 10.1016/j.ultramic.2011.10.001
7. G. Gaertner and H. W. P. Koops, in Vacuum Electronics, edited by, J. A. Eichmeir, and, M. K. Thumm, (Springer-Verlag, Berlin, 2008).
8. S. Yamamoto, Rep. Prog. Phys. 69, 181 (2006). 10.1088/0034-4885/69/1/R04
9. V. Vlahos, Y. L. Lee, J. H. Booske, D. Morgan, L. Turek, M. Kirshner, R. Kowalczyk, and C. Wilsen, Appl. Phys. Lett. 94, 184102 (2009). 10.1063/1.3129193
10. V. Vlahos, J. H. Booske, and D. Morgan, Phys. Rev. B 81, 054207 (2010). 10.1103/PhysRevB.81.054207
11. W. Telieps and E. Bauer, Ultramicroscopy 17, 57 (1985). 10.1016/0304-3991(85)90177-9
12. L. H. Veneklasen, Rev. Sci. Instrum. 63, 5513 (1992). 10.1063/1.1143377
13. E. L. Montei, V. W. Ballarotto, M. E. Little, and M. E. Kordesch, J. Electron. Spectrosc. 84, 129 (1997). 10.1016/S0368-2048(97)00008-X
14. M. E. Kordesch, in In Situ Real-Time Characterization of Thin Films, edited by, O. Auciello, and, A. R. Krauss, (John Wiley and Sons, New York, 2001), pp. 217-260.
15. M. S. Altman, J. Phys.-Condens. Mater. 22, 084017 (2010). 10.1088/0953-8984/22/8/084017
16. T. Hagizawa, Y. Kuroki, T. Okamoto, and M. Takata, IOP Conf. Series: Mater. Sci. Eng. 21, 012019 (2011). 10.1088/1757-899X/21/1/012019
17. S. Dushman, Rev. Mod. Phys. 2, 381 (1930). 10.1103/RevModPhys.2.381
18. K. L. Jensen, D. W. Feldman, N. A. Moody, and P. G. O'Shea, J. Appl. Phys. 99, 124905 (2006). 10.1063/1.2203720
19. K. L. Jensen, J. Appl. Phys. 85, 2667 (1999). 10.1063/1.369584
20. T. T. Basiev, A. A. Sobol, P. G. Zverev, L. I. Ivlevaa, V. V. Osikoa, and R. C. Powell, Opt. Mater. 11, 307 (1999). 10.1016/S0925-3467(98)00030-5
21. A. Ubaldini and M. M. Camasciali, J. Alloy Compd. 454, 374 (2008). 10.1016/j.jallcom.2006.12.067
22. J. A. Horsley, I. E. Wachs, J. M. Brown, G. H. Via, and F. D. Hardcastle, J. Phys. Chem. 91, 4014 (1987). 10.1021/j100299a018
23. G. Blasse and G. P. M. van den Heuvel, J. Lumin. 8, 406 (1974). 10.1016/0022-2313(74)90081-7
24. A. Phuruangrat, T. Thongtem, and S. Thongtem, J. Phys. Chem. Solids 70, 955 (2009). 10.1016/j.jpcs.2009.05.006
25. K. P. F. Siqueira and A. Dias, J. Nanopart. Res. 13, 5927 (2011). 10.1007/s11051-011-0248-8
26. See supplementary material at http://dx.doi.org/10.1116/1.4772007 E-JVTBD9-31-336301 for a wide field of view FESEM image of the sample type shown in Fig..
27. F. Cheynis, E. Bussmann, F. Leroy, T. Passante, and P. Mueller, Phys. Rev. B 84, 245439 (2011). 10.1103/PhysRevB.84.245439
28. Capillarity and Wetting Phenomena, edited by, P. de Gennes, F. Brochard-Wyart, and, D. Quere, (Springer-Verlag, New York, 2004), pp. 153-190.
29. S. H. Magnus, D. N. Hill, and W. H. Ohlinger, Appl. Surf. Sci. 111, 55 (1997). 10.1016/S0169-4332(96)00714-3
30. V. V. Fomichev and O. I. Kondratov, Spectrochim. Acta A 50, 1113 (1994). 10.1016/0584-8539(94)80034-0
31. J. Shi and D. L. Allara, Langmuir 12, 5099 (1996). 10.1021/la960196+
32. V. V. Fomichev, Russ. Chem. Bull. 43, 1943 (1994). 10.1007/BF00700151
33. A. Shih, J. E. Yater, C. Hor, and R. Abrams, Appl. Surf. Sci. 211, 136 (2003). 10.1016/S0169-4332(03)00250-2
34. A. Shih, J. E. Yater, and C. Hor, Appl. Surf. Sci. 242, 35 (2005). 10.1016/j.apsusc.2004.07.067
35. R. T. Longo, J. Appl. Phys. 94, 6966, (2003). 10.1063/1.1621728
36. S. H. Magnus, D. N. Hill, and W. H. Ohlinger, Appl. Surf. Sci. 111, 42 (1997). 10.1016/S0169-4332(96)00700-3
37. Y. Wang, J. Wang, W. Liu, X. Zhang, and L. Li, J. Vac. Sci. Technol. B 29 04E106 (2011). 10.1116/1.3609251
38. R. M. Jacobs, J. H. Booske, and D. Morgan, Phys. Rev. B 86, 054106 (2012). 10.1103/PhysRevB.86.054106