Emission properties of compounds in the BaO · Sc 2 O 3 · WO 3 ternary system

Applied Surface Science

Volumn 111, Issue , 1997, Pages 42-49

  Magnus, S H ^a   Hill, D N ^a   Ohlinger, W L ^b  

^a Georgia Institute of Technology   (United States)

^b WESTINGHOUSE ELECTRIC COMPANY   (United States)

Author keywords

Bulk thermochemistry; Emission properties; Scandate cathodes; Ternary compound

Indexed keywords

BARIUM COMPOUNDS; COMPOSITION EFFECTS; CURRENT DENSITY; ELECTRON EMISSION; INTERFACES (MATERIALS); OXIDES; SCANDIUM COMPOUNDS; SURFACE STRUCTURE; THERMIONIC CATHODES; TUNGSTEN;

BULK THERMOCHEMISTRY; SCANDATE CATHODES; WORK FUNCTION;

TERNARY SYSTEMS;

EID: 0031550391     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00700-3     Document Type: Article

References (13)

1. L.M. Kovba, L.N. Lykova, M.V. Paromova and T.A. Kalinina, Dokl. Akad. Nauk SSR 260(4) (1981) 924-927.
2. G. Hallum and R.K. Datta, J. Am. Ceram. Soc. 68(2) (1985) 68-69.
3. E.R. Kriedler, J. Am. Ceram. Soc. 55(10) (1972) 514.
4. M.P. Janowski, D.N. Hill, S.H. Magnus and W.L. Ohlinger, Poster Presentation IVESC 1996, July 1-4, Eindhoven, The Netherlands.
5. S.H. Magnus, D.N. Hill and W.L. Ohlinger, Poster Presentation at IVESC 1996, July 1-4, Eindhoven, The Netherlands.
6. S.H, Magnus, Doctoral Thesis, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA, March, 1996.
7. S. Yamamoto, I. Watanabe, S. Taguchi, S. Sasaki and T. Yaguchi, Jpn. J. Appl. Phys. 28(3) (1989) 490-494.
8. J. Hasker, Co. Crombeen, IEEE Trans. Electron Devices 37(12) (1990) 2585-2588.
9. J. Hasker, J. van Esdonk and J.E. Crombeen, Appl. Surf. Sci. 26 (1986) 173-195.
10. A. Figner, A. Soloveichik and I. Judinskaja, US Patent #3358178, filed October 1964, granted December 1967.
11. I.V. Yudinskaya, M.V. Paromova, L.N. Lykova and V.A. Leitskii, Izv. Akad. Nauk SSSR Neorg. Mater. 11(10) (1975) 1805-1808.
12. A. van Oostrom and L. Augustus, Appl, Surf. Sci. 2 (1974) 173-186.
13. G. Lesny and R. Forman, IEEE Trans. Electron Devices, 37(12) (1990) 2595-2604.