Dielectric properties of Fe-doped TiO2 nanoparticles synthesised by sol-gel route

Journal of Experimental Nanoscience

Volumn 8, Issue 2, 2013, Pages 171-183

  Singh, Davinder ^a   Yadav, Poonam ^a   Singh, Nafa ^b   Kant, Chander ^a   Kumar, Mahesh ^a   Sharma, Sunil D ^a   Saini, K K ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b KURUKSHETRA UNIVERSITY   (India)

Author keywords

crystallisation; dielectric; nanoparticles; sol gel; XPS; XRD

Indexed keywords

ANATASE PHASE; ATMOSPHERIC CONDITIONS; CONVENTIONAL SINTERING; CRYSTALLINE PHASE; DIELECTRIC BEHAVIOUR; DIELECTRIC CONSTANT VALUES; FE CONTENT; FE DOPING; FE-DOPED; FE-DOPED TIO; HIGHER FREQUENCIES; LARGE DISPERSION; MEASUREMENT FREQUENCY; NANOCRYSTALLINE SAMPLE; NANOCRYSTALLITE SIZE; NUMERICAL VALUES; OH IONS; PROPERTY MEASUREMENT; RUTILE PHASE; SAMPLE SURFACE; SOL-GEL ROUTES; TRANSMISSION ELECTRON MICROSCOPY TEM; XRD; XRD-PEAK BROADENING;

CRYSTALLITE SIZE; CRYSTALLIZATION; DIELECTRIC MATERIALS; NANOPARTICLES; OXIDE MINERALS; PHOTOELECTRONS; SINTERING; SOL-GEL PROCESS; SOL-GELS; TITANIUM; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC PROPERTIES;

IRON DOPED TITANIUM DIOXIDE NANOPARTICLE; NANOPARTICLE; TITANIUM DIOXIDE; UNCLASSIFIED DRUG;

ARTICLE; CRYSTALLIZATION; DIELECTRIC CONSTANT; DISPERSION; PRIORITY JOURNAL; PROCEDURES; SOL GEL TECHNIQUE; SYNTHESIS; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84872548318     PISSN: 17458080     EISSN: 17458099     Source Type: Journal    
DOI: 10.1080/17458080.2011.564215     Document Type: Article

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