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Volumn 64, Issue 7, 2003, Pages 1069-1087

Defect chemistry and semiconducting properties of titanium dioxide: III. Mobility of electronic charge carriers

Author keywords

A. Electronic materials; D. Defects; D. Electrical conductivity; D. Electrical properties; D. Semiconductivity; D. Transport properties

Indexed keywords

CHARGE CARRIERS; DEFECTS; ELECTRIC CONDUCTIVITY; MATHEMATICAL MODELS; SEMICONDUCTOR MATERIALS; TRANSPORT PROPERTIES;

EID: 0037879437     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(02)00481-X     Document Type: Article
Times cited : (64)

References (40)
  • 11
    • 0004289399 scopus 로고
    • J.J. Leamy, G.E. Pike, & C.H. Seager. Amsterdam: Elsevier
    • Yan M.F., Rhodes W.W. Leamy J.J., Pike G.E., Seager C.H. Grain Boundaries. 1982;357 Elsevier, Amsterdam.
    • (1982) Grain Boundaries , pp. 357
    • Yan, M.F.1    Rhodes, W.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.