Size-driven phase transition in stress-induced ferroelectric thin films

Solid State Communications

Volumn 118, Issue 5, 2001, Pages 241-246

  Zhang, Jian ^a   Yin, Zhen ^a   Zhang, Ming Sheng ^a   Scott, James F ^b  

^a NANJING UNIVERSITY   (China)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

A. Ferroelectrics; A. Thin films; B. Epitaxy; B. Laser processing; D. Dielectric response; D. Phase transitions

Indexed keywords

DIELECTRIC FILMS; EPITAXIAL GROWTH; LIGHT POLARIZATION; PHASE DIAGRAMS; PHASE TRANSITIONS; STRESS ANALYSIS; TENSILE STRESS;

CONCISE PHENOMENOLOGICAL THEORY; FERROELECTRIC-PARAELECTRIC TRANSITIONS;

FERROELECTRIC THIN FILMS;

EID: 0035953790     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(01)00085-0     Document Type: Article

References (30)