Parametric counterfeit IC detection via support vector machines

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2012, Pages 7-12

  Huang, Ke ^a   Carulli, John M ^b   Makris, Yiorgos ^a  

^a Department of Electrical and Computer Engineering   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

Counterfeit IC detection; one class SVM classifier; parametric burn in test

Indexed keywords

CLASSIFICATION (OF INFORMATION); CRIME; SUPPORT VECTOR MACHINES; TIMING CIRCUITS;

BURN-IN TEST; CIRCUIT BEHAVIORS; COUNTERFEIT INTEGRATED CIRCUIT DETECTION; NEW DEVICES; ONE-CLASS SUPPORT VECTOR MACHINE CLASSIFIER; PARAMETRIC BURN-IN TEST; PRIOR INFORMATION; PROCESS VARIATION; SUPPORT VECTOR MACHINE CLASSIFIERS; SUPPORT VECTORS MACHINE;

INTEGRATED CIRCUITS;

EID: 84872332147     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2012.6378191     Document Type: Conference Paper

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