Characterization of charge carrier injection in organic and hybrid organic/inorganic semiconductor devices by capacitance-voltage measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8476, Issue , 2012, Pages

  Weingarten, M ^a   Slawinski, M ^a   Urbain, F ^a   Fahle, D ^a   Bertram, D ^b   Heuken, M ^a,c   Kalisch, H ^a   Vescan, A ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

^c AIXTRON AG   (Germany)

Author keywords

Capacitance voltage measurement; Charge injection; Hybrid heterostructures; Organic semiconductors

Indexed keywords

AMBIPOLAR; BI-LAYER; C-V CHARACTERISTIC; C-V MEASUREMENT; CAPACITANCE VOLTAGE MEASUREMENTS; CHARGE CARRIER INJECTION; COST-EFFICIENT; ENERGETIC BARRIERS; HOLE INJECTION; I-V MEASUREMENTS; INCREASED TEMPERATURE; INORGANIC SEMICONDUCTORS; KEY TECHNOLOGIES; LOW BIAS VOLTAGE; MICRODISPLAYS; MULTI-LAYER DEVICES; MULTILAYER STACKS; ORGANIC INTERFACES; ORGANIC VAPOR PHASE DEPOSITION; ORGANIC/INORGANIC SEMICONDUCTORS; PENTACENES; TEST STRUCTURE;

CHARGE CARRIERS; CHARGE INJECTION; ELECTRON INJECTION; GALLIUM NITRIDE; LIGHT EMISSION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MULTILAYERS; SEMICONDUCTING ORGANIC COMPOUNDS; VAPORS; VOLTAGE MEASUREMENT;

HETEROJUNCTIONS;

EID: 84872130590     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.929582     Document Type: Conference Paper

References (7)

1. Nowy, S., Ren, W., Wagner, J., Weber, J., and Brütting, W., "Impedance spectroscopy of organic hetero-layer oleds as a probe for charge carrier injection and device degradation," in [Proc. of SPIE Vol], 7415, 74150G-1 (2009).
2. Nowy, S., Ren, W., Elschner, A., Lövenich, W., and Brütting, W., "Impedance spectroscopy as a probe for the degradation of organic light-emitting diodes," Journal of Applied Physics 107(5), 054501-054501 (2010).
3. Brütting, W., Berleb, S., and Mückl, A., "Device physics of organic light-emitting diodes based on molecular materials," Organic Electronics 2(1), 1-36 (2001).
4. Ehrenfreund, E., Lungenschmied, C., Dennler, G., Neugebauer, H., and Sariciftci, N., "Negative capacitance in organic semiconductor devices: Bipolar injection and charge recombination mechanism," Applied physics letters 91, 012112 (2007).
5. Shtein, M., Mapel, J., Benziger, J., and Forrest, S., "Effects of film morphology and gate dielectric surface preparation on the electrical characteristics of organic-vapor-phase-deposited pentacene thin-film transistors," Applied physics letters 81(2), 268-270 (2002).
6. Chai, S., Wen, S., Huang, J., and Han, K., "Density functional theory study on electron and hole transport properties of organic pentacene derivatives with electron-withdrawing substituent," Journal of Computational Chemistry (2011).
7. Kepler, R., Beeson, P., Jacobs, S., Anderson, R., Sinclair, M., Valencia, V., and Cahill, P., "Electron and hole mobility in tris (8-hydroxyquinolinolato-n1, o8) aluminum," Applied physics letters 66(26), 3618-3620 (1995).