Negative capacitance in organic semiconductor devices: Bipolar injection and charge recombination mechanism

Applied Physics Letters

Volumn 91, Issue 1, 2007, Pages

  Ehrenfreund, E ^a,b   Lungenschmied, C ^a   Dennler, G ^a,c   Neugebauer, H ^a   Sariciftci, N S ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c Konarka Austria Forschungs und Entwicklungs GmbH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INJECTIONS; ELECTRON HOLE ANNIHILATION; NEGATIVE CAPACITANCE; RECOMBINATION PROCESS;

BIAS VOLTAGE; CAPACITANCE; DIODES; ELECTRIC CURRENTS; ELECTRON TRAPS;

SEMICONDUCTOR DEVICES;

EID: 36049017712     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2752024     Document Type: Article

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