메뉴 건너뛰기




Volumn 110, Issue , 2013, Pages 77-86

A two-diode model regarding the distributed series resistance

Author keywords

Characterization; Current voltage characteristic; Fit; Simulation; Two diode model

Indexed keywords

CURRENT DEPENDENCE; CURRENT DISTRIBUTION; DIODE PARAMETERS; FIT; HIGH CURRENT DENSITIES; HIGH CURRENTS; LARGE CURRENT DENSITY; MULTICRYSTALLINE SOLAR CELLS; PARALLEL RESISTANCE; PARAMETER SET; SERIES RESISTANCES; SIMULATION; SUPERPOSITION PRINCIPLE; TWO-DIODE MODEL;

EID: 84872061143     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2012.11.021     Document Type: Article
Times cited : (60)

References (25)
  • 2
    • 84927553170 scopus 로고
    • Carrier generation and recombination in p-n junctions and p-n junction characteristics
    • C.T. Sah, R.N. Noice, and W. Shockley Carrier generation and recombination in p-n junctions and p-n junction characteristics Proceedings of the IRE 45 1957 1228 1243
    • (1957) Proceedings of the IRE , vol.45 , pp. 1228-1243
    • Sah, C.T.1    Noice, R.N.2    Shockley, W.3
  • 3
    • 0034228219 scopus 로고    scopus 로고
    • Reduced fill factors in multicrystalline silicon solar cells due to injection-level dependent bulk recombination lifetimes
    • D. Macdonald, and A. Cuevas Reduced fill factors in multicrystalline silicon solar cells due to injection-level dependent bulk recombination lifetimes Progress in Photovoltaics Research and Application 8 2000 363 375
    • (2000) Progress in Photovoltaics Research and Application , vol.8 , pp. 363-375
    • MacDonald, D.1    Cuevas, A.2
  • 4
    • 79960523265 scopus 로고    scopus 로고
    • Explanation of commonly observed shunt currents in c-Si solar cells by means of recombination statistics beyond the Shockley-Read-Hall approximation
    • S. Steingrube, O. Breitenstein, K. Ramspeck, S. Glunz, A. Schenk, and P.P. Altermatt Explanation of commonly observed shunt currents in c-Si solar cells by means of recombination statistics beyond the Shockley-Read-Hall approximation Journal of Applied Physics 110 2011 014515
    • (2011) Journal of Applied Physics , vol.110 , pp. 014515
    • Steingrube, S.1    Breitenstein, O.2    Ramspeck, K.3    Glunz, S.4    Schenk, A.5    Altermatt, P.P.6
  • 5
    • 33847641339 scopus 로고    scopus 로고
    • Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging
    • T. Trupke, E. Pink, R.A. Bardos, and M.D. Abbott Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging Applied Physics Letters 90 2007 093506
    • (2007) Applied Physics Letters , vol.90 , pp. 093506
    • Trupke, T.1    Pink, E.2    Bardos, R.A.3    Abbott, M.D.4
  • 6
    • 0022686063 scopus 로고
    • Effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells
    • G.L. Araújo, A. Cuevas, and J.M. Ruiz The effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells IEEE Transactions on Electron Devices 33 1986 391 401 (Pubitemid 16576206)
    • (1986) IEEE Transactions on Electron Devices , vol.ED-33 , Issue.3 , pp. 391-401
    • Araujo Gerardo, L.1    Cuevas Andres2    Ruiz Jose, M.3
  • 12
    • 0000348191 scopus 로고
    • Departures from the principle of superposition in silicon solar cells
    • S.R. Robinson, A.G. Aberle, and M.A. Green Departures from the principle of superposition in silicon solar cells Journal of Applied Physics 76 1994 7920 7930
    • (1994) Journal of Applied Physics , vol.76 , pp. 7920-7930
    • Robinson, S.R.1    Aberle, A.G.2    Green, M.A.3
  • 13
  • 15
    • 34247266125 scopus 로고    scopus 로고
    • Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography
    • K. Ramspeck, K. Bothe, D. Hinken, B. Fischer, J. Schmidt, and R. Brendel Recombination current and series resistance imaging of solar cells by combined luminescence and lock-in thermography Applied Physics Letters 90 2007 153502
    • (2007) Applied Physics Letters , vol.90 , pp. 153502
    • Ramspeck, K.1    Bothe, K.2    Hinken, D.3    Fischer, B.4    Schmidt, J.5    Brendel, R.6
  • 17
    • 84873867481 scopus 로고    scopus 로고
    • Evaluation of luminescence images of solar cells for injection-level dependent lifetimes
    • in press
    • S. Rißland, O. Breitenstein, Evaluation of luminescence images of solar cells for injection-level dependent lifetimes, Solar Energy Materials and Solar Cells, http://dx.doi.org/10.1016/j.solmat.2012.12.024, in press.
    • Solar Energy Materials and Solar Cells
    • S. Rißland1
  • 18
    • 84872089345 scopus 로고    scopus 로고
    • 〈http://www.wolfram.com/mathematica/〉
  • 19
    • 77957653249 scopus 로고    scopus 로고
    • Analysis of multi-crystalline silicon solar cells at low illumination levels using a modified two-diode model
    • A. Kassis, and M. Saad Analysis of multi-crystalline silicon solar cells at low illumination levels using a modified two-diode model Solar Energy Materials and Solar Cells 94 2010 2108 2112
    • (2010) Solar Energy Materials and Solar Cells , vol.94 , pp. 2108-2112
    • Kassis, A.1    Saad, M.2
  • 22
    • 84861714963 scopus 로고    scopus 로고
    • High resolution saturation current density imaging at grain boundaries by lock-in thermography
    • S. Rißland, and O. Breitenstein High resolution saturation current density imaging at grain boundaries by lock-in thermography Solar Energy Materials and Solar Cells 104 2012 121 124
    • (2012) Solar Energy Materials and Solar Cells , vol.104 , pp. 121-124
    • Rißland, S.1    Breitenstein, O.2
  • 24
    • 22144480285 scopus 로고    scopus 로고
    • Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence
    • T. Fuyuki, H. Kondo, T. Yamazaki, Y. Takahashi, and Y. Uraoka Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence Applied Physics Letters 86 2005 262108
    • (2005) Applied Physics Letters , vol.86 , pp. 262108
    • Fuyuki, T.1    Kondo, H.2    Yamazaki, T.3    Takahashi, Y.4    Uraoka, Y.5
  • 25
    • 84872066542 scopus 로고    scopus 로고
    • 〈http://www.max-planck-innovation.de/en〉


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.