High resolution saturation current density imaging at grain boundaries by lock-in thermography

Solar Energy Materials and Solar Cells

Volumn 104, Issue , 2012, Pages 121-124

  Rissland S ^a   Breitenstein, O ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

Deconvolution; Grain boundary; IV characteristics; Local analysis; Lock in thermography; Modeling

Indexed keywords

CARRIER COLLECTION; DOMINANT CONTRIBUTIONS; HIGH RESOLUTION; IV CHARACTERISTICS; LOCAL ANALYSIS; LOCKIN THERMOGRAPHY; MULTICRYSTALLINE; SATURATION CURRENT DENSITIES; SILICON MATERIALS;

DECONVOLUTION; DEFECTS; ELECTRONIC PROPERTIES; MODELS; OPEN CIRCUIT VOLTAGE; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

GRAIN BOUNDARIES;

EID: 84861714963     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2012.05.011     Document Type: Article

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