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Volumn 17, Issue 4, 2012, Pages 245-250

Ferromagnetic resonance and X-ray reflectivity studies of pulsed DC magnetron sputtered NiFe/IrMn/CoFe exchange bias

Author keywords

Exchange bias; Ferromagnetic resonance; Interface roughness; Pulsed DC magnetron sputtering

Indexed keywords


EID: 84872045026     PISSN: 12261750     EISSN: None     Source Type: Journal    
DOI: 10.4283/JMAG.2012.17.4.245     Document Type: Article
Times cited : (2)

References (22)
  • 3
    • 67649210589 scopus 로고    scopus 로고
    • Soeya, Appl. Phys. Lett. 94, 242507 (2009).
    • (2009) Appl. Phys. Lett , vol.94 , pp. 242507


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.