Effect of underlayer roughness, grain size, and crystal texture on exchange coupled IrMn/CoFe thin films

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6653-6655

  Pakala, M ^a   Huai, Y ^a   Anderson, G ^a   Miloslavsky, L ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001442291     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372800     Document Type: Article

References (9)

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