Microstructure and interface evolution of PtMn bottom spin-filter spin valves induced by stress and unidirectional field annealing

Journal of Physics Condensed Matter

Volumn 17, Issue 26, 2005, Pages 4073-4081

  Öksüzoglu, R Mustafa ^a   MacLaren, Ian ^b,d   Schug, Christoph ^c   Fuess, Hartmut ^b  

^a SELCUK UNIVERSITY   (Turkey)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c Naomi Technologies AG   (Germany)

^d UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ANNEALING; CHEMICAL SENSORS; DIFFUSION; GIANT MAGNETORESISTANCE; GRAIN GROWTH; INTERFACES (MATERIALS); MAGNETIC FIELD EFFECTS; MICROSTRUCTURE; PLATINUM COMPOUNDS; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

INTER-DIFFUSION; SPIN-FILTER SPIN VALVES (SFSV); UNIDIRECTIONAL FIELD ANNEALING (UDA); X-RAY REFLECTIVITY (XRR);

ELECTROCHEMISTRY;

EID: 21144439069     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/26/007     Document Type: Article

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