Effect of interfacial roughness configuration on the exchange-bias field in NiO based spin valves

Journal of Superconductivity and Novel Magnetism

Volumn 23, Issue 5, 2010, Pages 863-866

  Zhang, A M ^a,b   Cai, H L ^b   Wu, X S ^b  

^a HOHAI UNIVERSITY   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

Correlation length; Exchange bias field; Interface roughness

Indexed keywords

CORRELATION LENGTHS; DEPOSITION PARAMETERS; EXCHANGE BIAS; EXCHANGE-BIAS FIELDS; INTERFACE ROUGHNESS; INTERFACIAL MICROSTRUCTURE; INTERFACIAL ROUGHNESS; SPIN VALVE; SPUTTERING TECHNIQUES; TWO-DIMENSION; X RAY REFLECTIVITY; X-RAY DIFFUSE SCATTERING;

INTERFACES (MATERIALS); MAGNETIC PROPERTIES; MULTILAYERS; SOIL STRUCTURE INTERACTIONS; SPIN DYNAMICS; TEXTURES; X RAY DIFFRACTION; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 77954814611     PISSN: 15571939     EISSN: 15571947     Source Type: Journal    
DOI: 10.1007/s10948-010-0654-7     Document Type: Article

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