Demonstration of electrooptic modulation at 2165nm using a silicon Mach-Zehnder interferometer

Optics Express

Volumn 20, Issue 27, 2012, Pages 28009-28016

  Van Camp, Mackenzie A ^a   Assefa, Solomon ^a   Gill, Douglas M ^a   Barwicz, Tymon ^a   Shank, Steven M ^b   Rice, Philip M ^c   Topuria, Teya ^c   Green, William M J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MODULATORS; NANOPHOTONICS; SILICON;

BITRATES; DESIGN METHODOLOGY; ELECTRO-OPTIC MODULATION; EXTINCTION RATIOS; FIGURE OF MERITS; HIGH PERFORMANCE DEVICES; MACH ZEHNDER MODULATOR; MIDINFRARED;

MODULATION;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; INTERFEROMETRY; SEMICONDUCTOR; TELECOMMUNICATION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; SEMICONDUCTORS; TELECOMMUNICATIONS;

EID: 84872020688     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.028009     Document Type: Article

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