Photoemission study of cerium silicate model systems

Applied Surface Science

Volumn 265, Issue , 2013, Pages 817-822

  Skála, Tomáš ^a   Matolín, Vladimír ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

Author keywords

Cerium oxide; Cerium silicate; Photoelectron spectroscopy; Silicon; Thin layer growth

Indexed keywords

CATALYSIS; MICROELECTRONICS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTOEMISSION; PHOTONS; SILICA; SILICATES; SILICON; SILICON OXIDES;

FUNDAMENTAL STUDIES; MAXIMUM THICKNESS; MEASUREMENTS OF; MODEL SYSTEM; PHOTOEMISSION SPECTRA; SILICATE FILM; THIN LAYERS; TWO MODEL SYSTEMS;

CERIUM OXIDE;

EID: 84871934828     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.11.126     Document Type: Article

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