In situ X-ray characterization of piezoelectric ceramic thin films

American Ceramic Society Bulletin

Volumn 92, Issue 1, 2013, Pages 18-23

  Evans, Paul G ^a   Sichel Tissot, Rebecca J ^b  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b DREXEL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84871569086     PISSN: 00027812     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (20)

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