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Volumn 19, Issue 1, 2013, Pages 338-349

Comparative electrochemical and photophysical studies of tetrathiafulvalene-annulated porphyrins and their Znii complexes: The effect of metalation and structural variation

Author keywords

charge transfer; electrochemistry; photophysics; porphyrinoids; tetrathiafulvalenes

Indexed keywords

CHARGE TRANSFER TRANSITIONS; DFT CALCULATION; ELECTRON FLOW; ELECTRONIC COMMUNICATIONS; EXCITED-STATE DYNAMICS; EXCITED-STATE LIFETIME; HOMO-LUMO GAPS; INTRAMOLECULAR CHARGE TRANSFERS; INTRAMOLECULAR CHARGE-TRANSFER INTERACTIONS; MACROCYCLICS; METALATIONS; NEGATIVE VALUES; ONE-ELECTRON OXIDATION; PHOTOPHYSICAL; PHOTOPHYSICAL STUDIES; PHOTOPHYSICS; PLANARITY; PORPHYRINOIDS; POSITIVE SHIFT; REDOX CENTERS; REDOX CHEMISTRY; REDUCTION POTENTIAL; REDUCTION SIGNALS; SPECTRAL STUDIES; SPECTROSCOPIC STUDIES; SQUARE-WAVE; STERIC EFFECT; STRUCTURAL STUDIES; STRUCTURAL VARIATIONS; TETRATHIAFULVALENES; THEORETICAL STUDY; TRANSIENT ABSORPTION; VOLTAMMOGRAMS;

EID: 84871555752     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.201202727     Document Type: Article
Times cited : (21)

References (81)
  • 6
    • 34447331463 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2007, 46, 5125-5128
    • (2007) Angew. Chem. Int. Ed. , vol.46 , pp. 5125-5128
  • 19
    • 70349782203 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2009, 48, 3244-3266.
    • (2009) Angew. Chem. Int. Ed. , vol.48 , pp. 3244-3266
  • 21
  • 28
    • 79958294864 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2011, 50, 5699-5703
    • (2011) Angew. Chem. Int. Ed. , vol.50 , pp. 5699-5703
  • 31
  • 36
    • 17644395337 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2005, 44, 2225-2229
    • (2005) Angew. Chem. Int. Ed. , vol.44 , pp. 2225-2229
  • 48
    • 0035901526 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2001, 40, 1372-1409.
    • (2001) Angew. Chem. Int. Ed. , vol.40 , pp. 1372-1409
  • 51
  • 64
    • 0343980961 scopus 로고    scopus 로고
    • (Eds.: J. Jortner, M. Bixon), John Wiley & Sons, New York
    • N. Mataga, H. Miyasaka, in Electron Transfer (Eds.:, J. Jortner, M. Bixon,), John Wiley & Sons, New York, 1999, pp. 431-496, Part 2
    • (1999) Electron Transfer , Issue.PART 2 , pp. 431-496
    • Mataga, N.1    Miyasaka, H.2
  • 71
    • 75749083809 scopus 로고    scopus 로고
    • Gaussian, Inc., Wallingford CT
    • Gaussian 09, Revision A.1, M. J. Frisch, G. W. Trucks, H. B. Schlegel, G. E. Scuseria, M. A. Robb, J. R. Cheeseman, G. Scalmani, V. Barone, B. Mennucci, G. A. Petersson, H. Nakatsuji, M. Caricato, X. Li, H. P. Hratchian, A. F. Izmaylov, J. Bloino, G. Zheng, J. L. Sonnenberg, M. Hada, M. Ehara, K. Toyota, R. Fukuda, J. Hasegawa, M. Ishida, T. Nakajima, Y. Honda, O. Kitao, H. Nakai, T. Vreven, J. A. Jr.Montgomery, J. E. Peralta, F. Ogliaro, M. Bearpark, J. J. Heyd, E. Brothers, K. N. Kudin, V. N. Staroverov, R. Kobayashi, J. Normand, K. Raghavachari, A. Rendell, J. C. Burant, S. S. Iyengar, J. Tomasi, M. Cossi, N. Rega, N. J. Millam, M. Klene, J. E. Knox, J. B. Cross, V. Bakken, C. Adamo, J. Jaramillo, R. Gomperts, R. E. Stratmann, O. Yazyev, A. J. Austin, R. Cammi, C. Pomelli, J. W. Ochterski, R. L. Martin, K. Morokuma, V. G. Zakrzewski, G. A. Voth, P. Salvador, J. J. Dannenberg, S. Dapprich, A. D. Daniels, Ã. Farkas, J. B. Foresman, J. V. Ortiz, J. Cioslowski, D. J. Fox, Gaussian, Inc., Wallingford CT, 2009.
    • (2009) Gaussian 09, Revision A.1
    • Frisch, M.J.1
  • 74
    • 77955439754 scopus 로고    scopus 로고
    • Rigaku Americas Corportion, The Woodlands, TX
    • CrystalClear 1.40, Rigaku Americas Corportion, The Woodlands, TX, 2008.
    • (2008) CrystalClear 1.40
  • 76
    • 37549039510 scopus 로고    scopus 로고
    • Program for the Refinement of Crystal Structures, Acta Crystallogr. A
    • G. M. Sheldrick, SHELXL97, Program for the Refinement of Crystal Structures, Acta Crystallogr. A 2008, 64, 112-122.
    • (2008) SHELXL97 , vol.64 , pp. 112-122
    • Sheldrick, G.M.1
  • 80
    • 0346669314 scopus 로고
    • Tables 4.2.6.8 and 6.1.1.4 (Ed.: A. J. C. Wilson), Kluwer Academic Press, Boston
    • International Tables for X-ray Crystallography, Vol. C, Tables 4.2.6.8 and 6.1.1.4 (Ed.:, A. J. C. Wilson,), Kluwer Academic Press, Boston, 1992.
    • (1992) International Tables for X-ray Crystallography, Vol. C
  • 81
    • 84871244097 scopus 로고
    • Siemens Analytical X-ray Instruments, Inc., Madison
    • G. M. Sheldrick, SHELXTL/PC (Version 5.03), Siemens Analytical X-ray Instruments, Inc., Madison, 1994.
    • (1994) SHELXTL/PC (Version 5.03)
    • Sheldrick, G.M.1


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