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Volumn 112, Issue 9, 2012, Pages

Effect of (Bi, La)(Fe, Zn)O3 thickness on the microstructure and multiferroic properties of BiFeO3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); BI-LAYER; FERROELECTRIC BEHAVIOR; INTERFACE COUPLINGS; MAGNETIC BEHAVIOR; MULTIFERROIC PROPERTIES; ORIENTATION DEGREE; RADIO FREQUENCY SPUTTERING; SILICON SUBSTRATES;

EID: 84870882791     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764340     Document Type: Article
Times cited : (8)

References (22)
  • 14
    • 67649246400 scopus 로고    scopus 로고
    • 10.1002/adma.200802849
    • G. Catalan and J. F. Scott, Adv. Mater. 24, 2463 (2009). 10.1002/adma.200802849
    • (2009) Adv. Mater. , vol.24 , pp. 2463
    • Catalan, G.1    Scott, J.F.2
  • 17
    • 74549186581 scopus 로고    scopus 로고
    • 10.1016/j.actamat.2009.11.011
    • J. Wu and J. Wang, Acta Mater. 58, 1688 (2010). 10.1016/j.actamat.2009. 11.011
    • (2010) Acta Mater. , vol.58 , pp. 1688
    • Wu, J.1    Wang, J.2
  • 19
    • 77955826156 scopus 로고    scopus 로고
    • 10.1063/1.3452348
    • J. Wu and J. Wang, J. Appl. Phys. 108, 024104 (2010). 10.1063/1.3452348
    • (2010) J. Appl. Phys. , vol.108 , pp. 024104
    • Wu, J.1    Wang, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.